VMIVME-2510B 64-bit TTL Digital I/O with Built-in-Test

VMIVME-2510B 64-bit TTL Digital I/O with Built-in-Test

• The direction of each 8-bit port is individually programmable

• 64 mA sink capability

• Separate board address decoding for control and data registers

• Built-in-Test logic for fault detection and isolation

• Fail LED

• Compatible with VMIC’s Intelligent I/O Controller product line

• High reliability DIN-type I/O connections

• 8-, 16-, 32-bit transfers

• Optional open-collector outputs

Compatibility: VMEbus specification compatible

double-height form factor

I/O Connector Type: Dual 64-pin connector, DIN

41612

I/O Organization: Eight I/O ports; eight bits wide.

Addressable to any address within short supervisory or

short nonprivileged I/O map.

Addressing Scheme: Eight ports individually

addressable on 8- or 16-bit boundaries. Address DIP

switches provide unlimited short data I/O address map

selection.

Built-in-Test: Output data may be read back in

real-time or in an off-line mode. The off-line mode is

enabled by executing a write to the Control and Status

Register (CSR) to set the TEST MODE bits. With the

TEST MODE enabled, all outputs are in TRI-STATE.

Two TEST MODE bits are provided so that each

connector I/O (32 bits) can be tested independently if

necessary.

Fail LED: A Fail LED is provided that is illuminated

at power up and system reset. It may be extinguished

under program control upon a successful diagnostic

execution.

I/O Circuit: Transceivers support high current sink (64

mA) outputs. These octal bus transceivers are

SN74AS645 for the logic level TTL I/O option. The

open-collector option uses SN74AS641 type

transceivers. If the open-collector option is ordered, all

64 bits are output only.

Variations: This product may be purchased in the

following variations:

Model

No. Description

2510 Original Design - one test mode bit

2510A Two test mode bits (one per connector)

2510B Recommended for new designs

(two test mode bits)